Books by Taeho Kim

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International Money and Banking image

International Money and Banking

Author(s): Taeho Kim
ISBN-13: 9780415059442
Released: Jan 01, 1993
Format: Misc. Supplies, 384 pages
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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development image

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Author(s): Way Kuo
ISBN-13: 9780792381075
Edition: 1998
Publisher: Springer
Released: Jan 31, 1998
Format: Hardcover, 420 pages
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Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development image

Reliability, Yield, and Stress Burn-In: A Unified Approach for Microelectronics Systems Manufacturing & Software Development

Author(s): Way Kuo
ISBN-13: 9781461375968
Edition: Softcover reprint of the original 1st ed. 1998
Publisher: Springer
Released: Mar 14, 2014
Format: Paperback, 420 pages
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