<p>The 5th International Workshop on Beam Injection Assessment of Defects in Semiconductors (BIADS 98) focussed on many theoretical and experimental aspects of this topic. The aim was to bring together specialists working in the fields of both fundamental research and applications. There were more than 80 participants from 15 countries all over the world.</p>

Beam Injection Assessment of Defects in Semiconductors (Solid State Phenomena)

Engineering & Transportation

M. Kittler

Engineering

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Books by M. Kittler

See the best price to sell, buy, or rent books by M. Kittler. BookScouter helps to compare book prices from 25+ online bookstores and 30+ buyback vendors with a single search.

Beam Injection Assessment of Defects in Semiconductors (Solid State Phenomena)