<p>In the span of only a few decades, the finite element method has become an important numerical technique for solving problems in the subject of charged particle optics. The situation has now developed up to the point where finite element simulation software is sold commercially and routinely used in industry. The introduction of the finite element method in charged particle optics came by way of a PHD thesis written by Eric Munro at the University of Cambridge, England, in 1971 [1], shortly after the first papers appeared on its use to solve Electrical Engineering problems in the late sixties. Although many papers on the use of the finite element method in charged particle optics have been published since Munro's pioneering work, its development in this area has not as yet appeared in any textbook. This fact must be understood within a broader context. The first textbook on the finite element method in Electrical Engineering was published in 1983 [2]. At present, there are only a handful of other books that describe it in relation to Electrical Engineering topics [3], let alone charged particle optics. This is but a tiny fraction of the books dedicated to the finite element method in other subjects such as Civil Engineering. The motivation to write this book comes from the need to redress this imbalance. There is also another important reason for writing this book.</p>

The Finite Element Method in Charged Particle Optics (The Springer International Series in Engineering and Computer Science, 519)

Computers & Technology

Khursheed, Anjam

Computer Science

Springer

In the span of only a few decades, the finite element method has become an important numerical technique for solving problems in the subject of charged particle optics. The situation has now developed up to the point where finite element simulation software is sold commercially and routinely used in industry. The introduction of the finite element method in charged particle optics came by way of a PHD thesis written by Eric Munro at the University of Cambridge, England, in 1971 [1], shortly after the first papers appeared on its use to solve Electrical Engineering problems in the late sixties. Although many papers on the use of the finite element method in charged particle optics have been published since Munro's pioneering work, its development in this area has not as yet appeared in any textbook. This fact must be understood within a broader context. The first textbook on the finite element method in Electrical Engineering was published in 1983 [2]. At present, there are only a handful of other books that describe it in relation to Electrical Engineering topics [3], let alone charged particle optics. This is but a tiny fraction of the books dedicated to the finite element method in other subjects such as Civil Engineering. The motivation to write this book comes from the need to redress this imbalance. There is also another important reason for writing this book.

The Finite Element Method in Charged Particle Optics (The Springer International Series in Engineering and Computer Science)

An account of the conflict between science and religion in Western society, reviewed in the context of the discoveries in modern physics which are challenging both scientists and theologians to reconsider some of their most basic assumptions about the nature of the universe - and of man.

Science and Religion: Towards the Restoration of an Ancient Harmony

Religion & Spirituality

Religious Studies

Oneworld Pubns Ltd

The Universe Within: An Exploration of the Human Spirit

New Age & Spirituality

Secondary Electron Energy Spectroscopy in the Scanning Electron Microscope

Science & Math

Experiments, Instruments & Measurement

World Scientific Publishing Company

<p>This book contains proposals to redesign the scanning electron microscope, so that it is more compatible with other charged particle beam instrumentation and analytical techniques commonly used in surface science research. It emphasizes the concepts underlying spectrometer designs in the scanning electron microscope, and spectrometers are discussed under one common framework so that their relative strengths and weaknesses can be more readily appreciated. This is done, for the most part, through simulations and derivations carried out by the author himself.The book is aimed at scientists, engineers and graduate students whose research area or study in some way involves the scanning electron microscope and/or charged particle spectrometers. It can be used both as an introduction to these subjects and as a guide to more advanced topics about scanning electron microscope redesign.</p>

SCANNING ELECTRON MICROSCOPE OPTICS AND SPECTROMETERS

World Scientific Pub Co Inc

See the best price to sell, buy, or rent books by Khursheed, Anjam. BookScouter helps to compare book prices from 25+ online bookstores and 30+ buyback vendors with a single search.

Books by Khursheed, Anjam