Johnson, Noble M.

Books by Johnson, Noble M.

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Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials) image

Microscopic Identification of Electronic Defects in Semiconductors: Symposium Held April 15-18, 1985, San Francisco, California, U.S.A (Materials)

Author(s): Johnson, Noble M.

ISBN-13: 9780931837111

Publisher: Materials Research Society

Released: Jan 01, 1985

Format: Hardcover, 604 pages