Topics in this volume include: comparison of interferometric contouring techniques; comparison of visibility of standard scratches; and near-grazing illumination and shadowing of rough surfaces.

Selected Papers on Optical Methods in Surface Metrology (SPIE Milestone Series Vol. MS129)

Engineering & Transportation

David J. Whitehouse

Engineering

SPIE Press

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Books by David J. Whitehouse

See the best price to sell, buy, or rent books by David J. Whitehouse. BookScouter helps to compare book prices from 25+ online bookstores and 30+ buyback vendors with a single search.

Selected Papers on Optical Methods in Surface Metrology (SPIE Milestone Series Vol. MS129)